Split by AS.
Merge previously failing tests
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| Differential D23969
AMDGPU: Reorganize store tests ClosedPublic Authored by jvesely on Aug 28 2016, 12:26 AM.
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Event Timelinejvesely updated this object. jvesely added a child revision: D23971: AMDGPU/R600: Expand unaligned writes to local and global AS.Aug 28 2016, 12:37 AM
This revision is now accepted and ready to land.Sep 2 2016, 11:14 AM Closed by commit rL280523: AMDGPU: Reorganize store tests (authored by jvesely). · Explain WhySep 2 2016, 12:00 PM This revision was automatically updated to reflect the committed changes. jvesely marked an inline comment as done.
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Diff 70111 test/CodeGen/AMDGPU/store-global.ll
test/CodeGen/AMDGPU/store-local.ll
test/CodeGen/AMDGPU/store-v3i32.ll
test/CodeGen/AMDGPU/store.ll
test/CodeGen/AMDGPU/store.r600.ll
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If you're moving the tests around anyway, you should change the SI prefix to GCN for possible SI/VI divergence