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Unit Tests
Unit Tests
Time | Test | |
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60,060 ms | x64 debian > libFuzzer.libFuzzer::fuzzer-leak.test | |
60,030 ms | x64 debian > libFuzzer.libFuzzer::minimize_crash.test |
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| Differential D144144
[X86] Add tests for combining mask with shuffles; NFC ClosedPublic Authored by goldstein.w.n on Feb 15 2023, 3:29 PM.
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Event Timelinegoldstein.w.n added a child revision: D143860: [X86] Add additional operations that masked instructions can combine with.Feb 15 2023, 3:30 PM goldstein.w.n added a parent revision: D143789: [X86] Widen i16 shuffle masks if vector width < 512 even with BWI. This revision is now accepted and ready to land.Feb 17 2023, 2:39 AM Closed by commit rGd821ac1aaf94: Add tests for combining mask with shuffles; NFC (authored by goldstein.w.n). · Explain WhyFeb 26 2023, 10:12 AM This revision was automatically updated to reflect the committed changes.
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Diff 497824 llvm/test/CodeGen/X86/combine-mask-with-shuffle.ll
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