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[X86] Fast-isel tests for lowered truncation intrinsics

Authored by mike.dvoretsky on Jul 10 2018, 1:26 AM.

Description

[X86] Fast-isel tests for lowered truncation intrinsics

This patch adds fast-isel tests for the IR patterns produced for truncation
intrinsics in rC336643.

Differential Revision: https://reviews.llvm.org/D48822

llvm-svn: 336645